ef1da23cbc Applications Popular applications Composition Identification Crystal orientation Drug discovery Elemental analysis In vivo applications Non-destructive testing Particle size & shape Phasing protein structures Polymers & fibers Polymorphs Pore size distribution Qualitative analysis Quantitative analysis Semiconductor metrology Spectroscopy Structure based drug design Sulfur in petroleum Texture & pole figures Thin film analysis . All entries contain atomic coordinates, based on which the corresponding powder diffraction patterns have been calculated. .. Along with the optional usage of COD reference data, the general handling of reference databases has been significantly improved: You can switch between different reference databases (e.g. Please click here to go to the update page, and download the update to latest version of Match! Note that the update (or online update) does not install any reference database! If you would like to install one of the free-of-charge reference pattern databases, you have to download and install them separately after you have installed the update to the new Match! version!.     24 7 DOC PPT TXT PDF XLS VIP VIP VIP VIP IT/ / / +ICDD+2008+PDF2PDF4+(1) drg19852011-04-1400 +ICDD+2008+PDF2PDF4+ 2 VIP 10 HR  BlogBBS (450*500pix) (630*500pix) 266  19 HR 0){%> >> * 240 .
Even for many samples other than minerals, the correct phases were identified in most cases, however, we found some (few) samples where main phases were not recognized because the corresponding reference patterns were not present in the COD reference database. 403 Forbidden . According to our experience, it is optimal to combine the COD database (which basically contains more recent entries) with a user database created from ICSD/Retrieve (which typically contains "older" entries).. Your browser doesn't accept cookies. By combining a reference database imported from ICSD/Retrieve (which typically contains "older" entries) with the free-of-charge COD reference database (which basically contains more recent entries, see below), you will get a real alternative to the PDF database at low price!. We have run several tests in order to evaluate the quality of the various reference databases mentioned above:. Cookies are required to use this site. Semiconductor metrology WaferX 310 WDA-3650 AZX 400 MFM310 TXRF 3760 TXRF 3800e Semiconductor metrology TXRF-450 TXRF-V450 TXRF-310 TXRF-310e TXRF-V310 VSEE300 Other products Stress XRD analyzers Vacuum feedthroughs X-ray detectors X-ray/EUV optics X-ray microscopes X-ray sources .
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